{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis","author_name":"L.J. Balk, W.H. Gerling, E. Wolfgang","thumbnail_url":"https://www.ebooknetworking.net/books/008/043/big0080439144.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0080439144.html\">Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis</a>","width":400,"height":300}