{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon)","author_name":"Laung-Terng Wang, Charles E. Stroud, Nur A. Touba","thumbnail_url":"https://www.ebooknetworking.net/books/012/373/big012373973X.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-012373973X.html\">System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon)</a>","width":400,"height":300}