{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (paperback) (Prentice Hall Modern Semiconductor Design Series: Prentice Hall Signal Integrity Library)","author_name":"Dennis Derickson, Marcus Müller","thumbnail_url":"https://www.ebooknetworking.net/books/013/335/big0133359484.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0133359484.html\">Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (paperback) (Prentice Hall Modern Semiconductor Design Series: Prentice Hall Signal Integrity Library)</a>","width":400,"height":300}