{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Defect and Microstructure Analysis by Diffraction (International Union of Crystallography Monographs on Crystallography, 10)","author_name":"Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge,","thumbnail_url":"https://www.ebooknetworking.net/books/019/850/big0198501897.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0198501897.html\">Defect and Microstructure Analysis by Diffraction (International Union of Crystallography Monographs on Crystallography, 10)</a>","width":400,"height":300}