{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Advanced Scanning Electron Microscopy and X-Ray Microanalysis","author_name":"Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury","thumbnail_url":"https://www.ebooknetworking.net/books/030/642/big0306421402.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0306421402.html\">Advanced Scanning Electron Microscopy and X-Ray Microanalysis</a>","width":400,"height":300}