{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Scanning Electron Microscopy and X-ray Microanalysis: Third Edition","author_name":"Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael","thumbnail_url":"https://www.ebooknetworking.net/books/030/647/big0306472929.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0306472929.html\">Scanning Electron Microscopy and X-ray Microanalysis: Third Edition</a>","width":400,"height":300}