{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Reliability Wearout Mechanisms in Advanced CMOS Technologies","author_name":"Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III","thumbnail_url":"https://www.ebooknetworking.net/books/047/173/big0471731722.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0471731722.html\">Reliability Wearout Mechanisms in Advanced CMOS Technologies</a>","width":400,"height":300}