{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Electron Microscopy and Analysis, Third Edition","author_name":"Peter J. Goodhew, John Humphreys, Richard Beanland","thumbnail_url":"https://www.ebooknetworking.net/books/074/840/big0748409688.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0748409688.html\">Electron Microscopy and Analysis, Third Edition</a>","width":400,"height":300}