{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Memory Technology, Design and Testing: 2000 IEEE International Workshop","author_name":"Design and Testing (8th : 2000 : San Jose, Calif.) IEEE International Workshop on Memory Technology","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0769506895.html\">Memory Technology, Design and Testing: 2000 IEEE International Workshop</a>","width":400,"height":300}