{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Statistical Metrology 1999 4th International Workshop","author_name":"IEEE, IEEE Electron Devices Society","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0780351541.html\">Statistical Metrology 1999 4th International Workshop</a>","width":400,"height":300}