{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development","author_name":"Way Kuo, Wei-Ting Kary Chien, Taeho Kim","thumbnail_url":"https://www.ebooknetworking.net/books/079/238/big0792381076.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0792381076.html\">Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing &amp; Software Development</a>","width":400,"height":300}