{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV: 23-24 September, 1998, Santa Clara, California (Spie Proceedings Series)","author_name":"","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0819429694.html\">Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV: 23-24 September, 1998, Santa Clara, California (Spie Proceedings Series)</a>","width":400,"height":300}