{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie)","author_name":"Michael T. Postek, John A. Allgair,","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-081947262X.html\">Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie)</a>","width":400,"height":300}