{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"X-Ray Metrology in Semiconductor Manufacturing","author_name":"D. Keith Bowen, Brian K. Tanner","thumbnail_url":"https://www.ebooknetworking.net/books/084/933/big0849339286.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0849339286.html\">X-Ray Metrology in Semiconductor Manufacturing</a>","width":400,"height":300}