{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)","author_name":"Lall, Pradeep","thumbnail_url":"https://www.ebooknetworking.net/books/084/939/big0849394503.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0849394503.html\">Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)</a>","width":400,"height":300}