{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Next Generation HALT and HASS: Robust Design of Electronics and Systems (Quality and Reliability Engineering Series)","author_name":"Kirk A. Gray, John J. Paschkewitz","thumbnail_url":"https://www.ebooknetworking.net/books/111/870/big1118700236.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-1118700236.html\">Next Generation HALT and HASS: Robust Design of Electronics and Systems (Quality and Reliability Engineering Series)</a>","width":400,"height":300}