{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"AFM-based measurement of the mechanical properties of thin polymer films and determination of the optical path length of nearly index-matched cavities.","author_name":"Christopher F Wieland","thumbnail_url":"https://www.ebooknetworking.net/books/124/353/big1243537310.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-1243537310.html\">AFM-based measurement of the mechanical properties of thin polymer films and determination of the optical path length of nearly index-matched cavities.</a>","width":400,"height":300}