{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)","author_name":"Leendert M. Huisman","thumbnail_url":"https://www.ebooknetworking.net/books/144/193/big1441937676.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-1441937676.html\">Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)</a>","width":400,"height":300}