{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)","author_name":"Niraj K. Jha, Sandip Kundu","thumbnail_url":"https://www.ebooknetworking.net/books/146/128/big1461288185.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-1461288185.html\">Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)</a>","width":400,"height":300}