{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition","author_name":"Department of Commerce","thumbnail_url":"https://www.ebooknetworking.net/books/149/474/big1494743582.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-1494743582.html\">The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition</a>","width":400,"height":300}