{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Biometric Quality: The Last 1%: Biometric Quality Assessment for Error Suppression","author_name":"Elham Tabassi, Patrick Grother, National Institute of Standards and Technology (NIST)","thumbnail_url":"https://www.ebooknetworking.net/books/149/598/big1495984508.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-1495984508.html\">Biometric Quality: The Last 1%: Biometric Quality Assessment for Error Suppression</a>","width":400,"height":300}