{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Advanced Production Testing of RF, SoC, and SiP Devices","author_name":"Joe Kelly, Michael D. Engelhardt","thumbnail_url":"https://www.ebooknetworking.net/books/158/053/big158053709X.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-158053709X.html\">Advanced Production Testing of RF, SoC, and SiP Devices</a>","width":400,"height":300}