{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Electromigration in Thin Films and Electronic Devices: Materials and Reliability (Woodhead Publishing Series in Optical and Electronic Materials)","author_name":"Choong-Un Kim","thumbnail_url":"https://www.ebooknetworking.net/books/184/569/big1845699378.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-1845699378.html\">Electromigration in Thin Films and Electronic Devices: Materials and Reliability (Woodhead Publishing Series in Optical and Electronic Materials)</a>","width":400,"height":300}