{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Spectroscopic Ellipsometry for the In-situ Investigation of Atomic Layer Depositions","author_name":"Varun Sharma","thumbnail_url":"https://www.ebooknetworking.net/books/365/692/big3656923159.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-3656923159.html\">Spectroscopic Ellipsometry for the In-situ Investigation of Atomic Layer Depositions</a>","width":400,"height":300}