{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Test Vector Reordering Method for  Low Power Testing: Test Vector Reordering Method for Minimizing Power Dissipation in VLSI Circuits using Functional Metrics","author_name":"K. Paramasivam, K. Gunavathi","thumbnail_url":"https://www.ebooknetworking.net/books/365/918/big3659180769.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-3659180769.html\">Test Vector Reordering Method for  Low Power Testing: Test Vector Reordering Method for Minimizing Power Dissipation in VLSI Circuits using Functional Metrics</a>","width":400,"height":300}