{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal  gated MOSFETs","author_name":"Marc Aoulaiche, Guido Groeseneken, Herman Maes","thumbnail_url":"https://www.ebooknetworking.net/books/383/836/big383836404X.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-383836404X.html\">Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal  gated MOSFETs</a>","width":400,"height":300}