{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"An Improved Markov Random Field Design Approach For Digital Circuits: Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And  MRF Designs","author_name":"Jahanzeb Anwer, Nor Hisham Bin Hamid, Vijanth Sagayan Asirvadam","thumbnail_url":"https://www.ebooknetworking.net/books/384/433/big3844332634.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-3844332634.html\">An Improved Markov Random Field Design Approach For Digital Circuits: Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And  MRF Designs</a>","width":400,"height":300}