{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Electromigration in Cu Interconnects: The Driving Force Formalism: Modeling and Experiment","author_name":"Dr. Arijit Roy","thumbnail_url":"https://www.ebooknetworking.net/books/384/541/big3845412925.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-3845412925.html\">Electromigration in Cu Interconnects: The Driving Force Formalism: Modeling and Experiment</a>","width":400,"height":300}