{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"VLSI testing methodology and can be measured Design","author_name":"LEI SHAO CHONG DENG ZHU","thumbnail_url":"https://www.ebooknetworking.net/books/712/100/big7121003791.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-7121003791.html\">VLSI testing methodology and can be measured Design</a>","width":400,"height":300}