{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors (SpringerBriefs in Physics)","author_name":"Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim","thumbnail_url":"https://www.ebooknetworking.net/books/940/076/big9400763913.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-9400763913.html\">Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors (SpringerBriefs in Physics)</a>","width":400,"height":300}