{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Electrical and reliability characteristics of sub-micron MOSFETs with N‚‚O nitrided gate oxides: Research project","author_name":"John T Krick","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B0006PB6N4.html\">Electrical and reliability characteristics of sub-micron MOSFETs with N‚‚O nitrided gate oxides: Research project</a>","width":400,"height":300}