{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Machine capability analysis: using a mobile metrology system to tweak machine performance can reduce defects and improve productivity.(Problem Solved): An article from: Circuits Assembly","author_name":"Peter Bollinger","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B00082YOMA.html\">Machine capability analysis: using a mobile metrology system to tweak machine performance can reduce defects and improve productivity.(Problem Solved): An article from: Circuits Assembly</a>","width":400,"height":300}