{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Optimizing component placement: CMM vs. AOI: together, non-contact coordinate measurement machines and automatic optical inspection systems can ... An article from: Circuits Assembly","author_name":"Vijay Patel","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B0008DY6HM.html\">Optimizing component placement: CMM vs. AOI: together, non-contact coordinate measurement machines and automatic optical inspection systems can ... An article from: Circuits Assembly</a>","width":400,"height":300}