{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Feinfocus' WBI-Fox x-ray: dynamic void detection in wafer bumps, without gray level definition.(Equipment Advances): An article from: Circuits Assembly","author_name":"Micha Lehnigk","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B0009H4V7C.html\">Feinfocus&#039; WBI-Fox x-ray: dynamic void detection in wafer bumps, without gray level definition.(Equipment Advances): An article from: Circuits Assembly</a>","width":400,"height":300}