{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Zero-defect IC inspection: anyway you look at it, camera view plays a key role in defect detection.(AOI): An article from: Circuits Assembly","author_name":"Peter Krippner","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B000CETV72.html\">Zero-defect IC inspection: anyway you look at it, camera view plays a key role in defect detection.(AOI): An article from: Circuits Assembly</a>","width":400,"height":300}