{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"ISO 15632:2002, Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors","author_name":"ISO/TC 202","thumbnail_url":"https://www.ebooknetworking.net/books/B00/0XY/bigB000XYSH0S.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B000XYSH0S.html\">ISO 15632:2002, Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors</a>","width":400,"height":300}