{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"When a good DOE goes bad: estimate the time constant of a process prior to conducting the DOE to prevent erroneous results.(FAB BASICS): An article from: Printed Circuit Design & Fab","author_name":"J. Lee Parker","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B001K9JTTS.html\">When a good DOE goes bad: estimate the time constant of a process prior to conducting the DOE to prevent erroneous results.(FAB BASICS): An article from: Printed Circuit Design &amp; Fab</a>","width":400,"height":300}