{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Optimization of test scheduling and test access for ITC-02 SOC benchmark circuits.(system-on-chip)(Technical report): An article from: Journal of Computer Science","author_name":"P. Sakthivel, Delhi R. Babu, P. Narayanasamy","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B002S1WR64.html\">Optimization of test scheduling and test access for ITC-02 SOC benchmark circuits.(system-on-chip)(Technical report): An article from: Journal of Computer Science</a>","width":400,"height":300}