{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Optical and dimensional-measurement problems with photomasking in microelectronics","author_name":"John M. Jerke","thumbnail_url":"https://www.ebooknetworking.net/books/B00/3YM/bigB003YMMXVK.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B003YMMXVK.html\">Optical and dimensional-measurement problems with photomasking in microelectronics</a>","width":400,"height":300}