{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script","author_name":"Martin G. Buehler","thumbnail_url":"https://www.ebooknetworking.net/books/B00/3YX/bigB003YXZIE8.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B003YXZIE8.html\">Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script</a>","width":400,"height":300}