{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Scanning electron microscope examination of wire bonds from high-reliability devices","author_name":"Kathryn O. Leedy","thumbnail_url":"https://www.ebooknetworking.net/books/B00/412/bigB004124N60.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B004124N60.html\">Scanning electron microscope examination of wire bonds from high-reliability devices</a>","width":400,"height":300}