{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Methods of measurement for semiconductor materials, process control, and devices","author_name":"United States. National Bureau of Standards.","thumbnail_url":"https://www.ebooknetworking.net/books/B00/41Q/bigB0041Q4DDY.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B0041Q4DDY.html\">Methods of measurement for semiconductor materials, process control, and devices</a>","width":400,"height":300}