{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (paperback) (Prentice Hall Modern Semiconductor Design Series: Prentice Hall Signal Integrity Library) by Derickson, Dennis, M��ller, Marcus (2012) Paperback","author_name":"","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B00NPNC5ZM.html\">Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (paperback) (Prentice Hall Modern Semiconductor Design Series: Prentice Hall Signal Integrity Library) by Derickson, Dennis, M��ller, Marcus (2012) Paperback</a>","width":400,"height":300}