{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"[(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010]","author_name":"Nicola Nicolici","thumbnail_url":"https://www.ebooknetworking.net/books/noimage.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-B010DSZP7G.html\">[(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010]</a>","width":400,"height":300}