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System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon)
Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Morgan Kaufmann
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A Designer's Guide to Built-In Self-Test (Frontiers in Electronic Testing)
Charles E. Stroud
Springer
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A Designer's Guide to Built-In Self-Test (Frontiers in Electronic Testing)
Charles E. Stroud
Springer
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System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)
Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Morgan Kaufmann
View Details ›