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Cher Ming Tan
Books by Cher Ming Tan
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Electromigration in ULSI Interconnections (International Series on Advances in Solid State Electronics and Technology) (International Series on ... Electronics and Technology (Unnumbered))
Cher Ming Tan
World Scientific Publishing Company
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Electromigration Modeling at Circuit Layout Level (SpringerBriefs in Applied Sciences and Technology / SpringerBriefs in Reliability)
Cher Ming Tan, Feifei He
Springer
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Springer Series in Reliability Engineering)
Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Springer
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Springer Series in Reliability Engineering)
Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Springer
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