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RYE: A realistic yield simulator for VLSIC structural failures (Research report / SRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering)
Ihao Chen
SRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering, Car
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A methodology for optimal test structure design statistical process characterization and diagnosis (Research report / SRC-CMU Research Center for ... Engineering, Carnegie-Mellon University)
Ihao Chen
SRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering, Car
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