Reliability of RoHS-Compliant 2D and 3D IC Interconnects (Electronic Engineering)

Name: Reliability of RoHS-Compliant 2D and 3D IC Interconnects (Electronic Engineering)
Author: John Lau
ISBN: 9780071753791

Author John Lau

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Book Details

Author(s)John Lau

ISBN / ASIN0071753796

ISBN-139780071753791

MarketplaceUnited States 🇺🇸