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Principles of Semiconductor Network Testing

Author Afshar, Amir
Publisher Newnes
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Book Details
Author(s)Afshar, Amir
PublisherNewnes
ISBN / ASIN0123992710
ISBN-139780123992710
AvailabilityIn Stock.
Sales Rank99,999,999
MarketplaceUnited States 🇺🇸

Description

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.