Electromigration and Electronic Device Degradation
📄 Viewing lite version
Full site ›
Book Details
Author(s)Wiley
PublisherWiley
ISBN / ASIN0471584894
ISBN-139780471584896
AvailabilityUsually ships within 5 to 6 days
CategoryHardcover
MarketplaceUnited States 🇺🇸
Description ▲
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
More Books in Hardcover
Teddy Bear's Dictionary
View
Podcast-Hábitos Atômicos: Um Método Fácil e Comprovado…
View
The People and Their Peace: Legal Culture and the Tran…
View
Phantasma (Deluxe Limited Edition) (Wicked Games)
View
White Chrysanthemum
View
Top 10: The Forty-Niners (Top Ten)
View
Time: From Concept to Narrative Construct: A Reader (N…
View
A Good Night for Mr.Coleman
View