Electromigration and Electronic Device Degradation
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Book Details
Author(s)Wiley
PublisherWiley
ISBN / ASIN0471584894
ISBN-139780471584896
AvailabilityUsually ships within 5 to 6 days
CategoryHardcover
MarketplaceUnited States 🇺🇸
Description ▲
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
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